EPOCH 4 

Ultrasonic Flaw Detector

The Panametrics-NDT™ EPOCH 4 is an advanced digital ultrasonic flaw detector that combines powerful, fully featured measurement capabilities, a comprehensive internal datalogger, and a wide range of software options to solve many demanding inspection problems.

Signal processing features include a 25 MHz bandwidth to permit testing of thinner materials, a selectable square wave pulser to optimize penetration on thick or attenuating materials, and narrowband filters to improve signal-to-noise ratio in high gain applications. The EPOCH 4 incorporates rugged packaging and a conveniently organized direct-access keypad.

A large capacity datalogger allows field storage of test data that can then be transferred to the PC via its versatile GageView PRO Interface Program.

The EPOCH 4 with its robust packaging design, large display, and functional color-coded keypad provides easy and fast operation in difficult inspection environments. Important keys such as Gain, Freeze, Save Thickness, Save Waveform, Enter, and Slewing Keys are grouped together for easy thumb control and one-handed operation of all critical parameter settings.

The five Function keys allow quick access to present parameter values that cam be customised by the operator.  

Features

• Customizable narrowband filtering
• Selectable, tunable square wave or negative spike excitation pulser
• Light, ergonomically designed (5.7 lbs / 2.6 Kg)
• Large, bright, high-resolution ELD with full/split screen views
• Automated transducer calibration
• 400” (10,000 mm) full screen range at longitudinal velocity of steel
• Display Freeze holds waveform and soundpath data
• Peak Hold and Peak Memory
• RF display mode
• Alarms, threshold positive/negative, or minimum depth
• Dual Gate with Echo-to-Echo measurements
• Security Key enables remote upgrade of software options
• Tunable Square Wave Pulser – Standard Feature

The EPOCH 4 set a new industry standard in 2001 when it was introduced with both a Tunable Square Wave Pulser and a Negative Spike Pulser. These high voltage pulsers offer the operator extensive application versatility and ease of use. The Tunable Square Wave Pulser along with Narrowband filtering produce class-leading material penetration and signal-to-noise ratios in difficult materials such as cast materials, large forgings, composites, and plastics.

International Versatility 

The EPOCH 4’s keypad is available in English or International Symbols.

Display languages are keypad selectable in French, German, Spamish, Italian, Russian, Japanese, English, and a custom user defined language.

Sophisticated Alphanumeric Internal Datalogger

The EPOCH 4’s sophisticated datalogger is designed for ease of use while

providing a wide range of features for virtually all flaw detection and thickness

gaging applications. All saved data can be organized in alphanumeric file

names and identifier (ID) codes that can be scrolled and reviewed on-screen. A

Memo feature permits entry of additional inspection data and the Edit feature can

be used to add, delete, or clear file names and ID numbers.

Save and recall inspection data sets in any combination of 500 waveforms (or

instrument setups) or 10,000 thickness readings. The expandable memory option

saves any combination of up to 2,000 waveforms or 40,000 thickness readings.

Extensive Documentation and Transfer Capabilities

The optional Windows-based GageView™ Pro Interface program adds practical

collection, editing, and review capabilities to the EPOCH 4. GageView Pro is a

powerful tool that collects, manages, and formats stored inspection data.

GageView Pro database tracking allows setup of inspection plans with pre-loaded

calibrations, IDs, and memos. Data can be printed or easily copied and pasted into word processing and spreadsheet documents for further reporting needs.

GageView Pro is compatible with the EPOCH 4, EPOCH LT,

EPOCH 4B, EPOCH 4PLUS and EPOCH XT flaw detectors.

Standard Software

DAC (Distance Amplitude Correction)

Calculates signal amplitude as a percentage or dB difference of the DAC

curve level (ASME, ASME-3, or JIS). Same size reflectors peak along the curve

independent of their location. An alarm can be activated when a gated signal

breaks the curve.

TVG (Time Varied Gain)

TVG with 40 dB dynamic range corrects for distance/amplitude variations due to material attenuation and beam spreading. Reference echoes are brought to a standard full screen level of 80%.

Software Options

CSC (Curved Surface Correction)

Corrects sound path information when using an angle beam transducer to

inspect a curved surface circumferentially.

Spotweld Overlay

The Weld Overlay feature allows on screen comparison of the live waveform

with a stored reference waveform. The Stamping feature permits stored weld

data to be stamped “good”, “undersized”, “stick”, or two other operator defined conditions. (PN: EP4/SPOTWELD)

DGS/AVG – Now set-up on board!

Flaw sizing technique that permits echo signals to be evaluated using DGS/AVG

diagram associated with a particular type of probe and material. The DGS/AVG

diagram shows the relationship among echo height, flaw size, and distance from

the transducer. (PN: EP4/DGS/AVG)

Floating Gate

Automatically varies Gate Level by -6 dB or -12 dB of the gated backwall echo.

Results in consistency of edge-depth measurements by making readings at the

same relative amplitude. (PN: EP4/FG)

Interface Gate

Powerful tool for immersion applications where the water path distance between

the transducer and front surface of the part is continually changing. Maintains

the Interface Echo (between the water and the front surface of the part) on the

left side of the EPOCH 4’s display. (PN: EP4/IG)

AWS D1.1 and D1.5

Provides a dynamic reflector “indication rating” for various AWS weld inspection

applications. This allows for a more efficient inspection by eliminating manual calculations. (PN: EP4/AWS)

Wave Analysis

Used to select particular points along an RF waveform and then obtain a timing/thickness measurement and also a dB difference between the two points.

Applications include measuring the scale/oxide buildup on the inner diameter of boiler tubes. (PN: EP4/WAVE)

Expanded Memory

Increases datalogger capacity from 500 waveforms/10,000 thickness readings to 2,000 waveforms/40,000 thickness readings. (PN: EP4/ MEM)

Advanced DAC/TVG: Calculates signal amplitude as a percentage or

dB level compared to a DAC curve, or a reference echo amplitude fixed with Time Varied Gain. DAC versions include ASME, ASME 3, JIS, and Custom. Contains several key features including: dynamically adjustable DAC curves, switchable DAC & TVG views, 80%-20% DAC/TVG, a flexible TVG table, and custom DAC warning curves. (PN: EP4/ADT)

High PRF (1,000 Hz)

Increases the PRF rate of the EPOCH 4 and is useful for higher scanning speed inspections. The high PRF software fixes the PRF at 1 KHz. (PN: EP4/HPRF)

Low PRF (30 Hz)

Reduces or eliminates “wrap-around” noise by setting the PRF to a fixed 30 Hz. This feature is often necessary when inspecting materials that are highly attenuating or have long sound paths. (PN: EP4/LPRF)

Auto-Freeze

Provides the ability to automatically freeze the A-Scan waveform when a gate alarm has been triggered. (PN: EP4/AUTOFREEZE)

B-scan

Generates an easy to understand cross[1]sectional profile view of an inspected part. Excellent for corrosion mapping of pipes, boilers, and storage tanks. This view can be used to visually verify acquired thickness measurements and also highlight areas with critically thin thickness values. Contact Olympus NDT for a detailed brochure on the B-Scan option. (PN: EP4/BSCAN)

GageView Pro

A powerful software that collects, manages, and formats stored inspection data. (PN: GAGEVIEWPRO-KIT-SERIAL)

API 5UE: Allows defect sizing according to API Recommended Practice 5UE.

Uses the Amplitude Distance Differential Technique (ADDT) to measure the size of potential defects during the prove-up process of OCTG pipe. The measurement process is simple and repeatable since all ADDT variables are captured from a Peak Memory envelope. (PN: EP4/API5UE)